Improving microstructural quantification in FIB/SEM nanotomography
![Improving microstructural quantification in FIB/SEM nanotomography](https://usg.fei-software-center.com/backoffice/wp-content/uploads/2018/01/1-s2.0-S0304399116302261-gr10.jpg)
Advanced nanotomographic analysis is still far from routine, and a number of challenges remain in data acquisition and post-processing. In this work, we present a number of techniques to improve the quality of the acquired data, together with easy-to-implement methods to obtain “advanced” microstructural quantifications. The techniques are applied to a solid oxide fuel cell cathode of interest to the electrochemistry community, but the methodologies are easily adaptable to a wide range of material systems.